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» Detecting resistive shorts for CMOS domino circuits
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ITC
1998
IEEE
89views Hardware» more  ITC 1998»
13 years 9 months ago
Detecting resistive shorts for CMOS domino circuits
We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detec...
Jonathan T.-Y. Chang, Edward J. McCluskey
DFT
2000
IEEE
105views VLSI» more  DFT 2000»
13 years 9 months ago
Low-Speed Scan Testing of Charge-Sharing Faults for CMOS Domino Circuits
Because domino logic design offers smaller area and higher speed than complementary CMOS design, it has been very popularly used to design highperformance processors. However: dom...
Ching-Hwa Cheng, Jinn-Shyan Wang, Shih-Chieh Chang...
ATS
2000
IEEE
149views Hardware» more  ATS 2000»
13 years 9 months ago
Charge sharing fault analysis and testing for CMOS domino logic circuits
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic ...
Ching-Hwa Cheng, Wen-Ben Jone, Jinn-Shyan Wang, Sh...
ISCAS
2006
IEEE
135views Hardware» more  ISCAS 2006»
13 years 11 months ago
Wide temperature spectrum low leakage dynamic circuit technique for sub-65nm CMOS technologies
A new circuit technique is proposed in this paper for simultaneously reducing the subthreshold and gate oxide leakage power in domino logic circuits. PMOS-only sleep transistors ar...
Volkan Kursun, Zhiyu Liu
ISCAS
2005
IEEE
224views Hardware» more  ISCAS 2005»
13 years 10 months ago
A high-speed domino CMOS full adder driven by a new unified-BiCMOS inverter
— A new operation mode using a partially depleted hybrid lateral BJT-CMOS inverter on SOI, named as a new unified-BiCMOS (U-BiCMOS) inverter, is proposed. The scheme utilizes the...
Toshiro Akino, Kei Matsuura, Akiyoshi Yasunaga