8 search results - page 1 / 2 » Detection of CMOS Defects under Variable Processing Conditio... |
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ISPW
2005
IEEE
13 years 10 months ago
2005
IEEE
Abstract. Answering “macro-process” research issues – which require understanding how development processes fit or do not fit in different organizational systems and environm...
GLVLSI
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...