12 search results - page 2 / 3 » Effectiveness and scaling trends of leakage control techniqu... |
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
— In this paper we explore the relationship between power and area. By exploiting parallelism (and thus using more area) one can reduce the switching frequency allowing a reducti...
DATE
2009
IEEE
14 years 1 days ago
2009
IEEE
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
ASPDAC
2009
ACM
13 years 10 months ago
2009
ACM
— In three-dimensional (3D) chips, the amount of supply current per package pin is significantly more than in two-dimensional (2D) designs. Therefore, the power supply noise pro...
ISLPED
2003
ACM
13 years 10 months ago
2003
ACM
The increasing prominence of portable systems and the need to limit power consumption and hence, heat dissipation in very high density VLSI chips have led to rapid and innovative ...
TVLSI
2010
12 years 12 months ago
2010
Dynamic gates have been excellent choice in the design of high-performance modules in modern microprocessors. The only limitation of dynamic gates is their relatively low noise mar...