21 search results - page 3 / 5 » Fault Diagnosis in Scan-Based BIST |
ISQED
2003
IEEE
13 years 11 months ago
2003
IEEE
We present a new technique for generating compact dictionaries for cause-effect diagnosis in BIST. This approach relies on the use of three compact dictionaries: (i) D1, containin...
DSD
2007
IEEE
14 years 12 days ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
ITC
1999
IEEE
13 years 10 months ago
1999
IEEE
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
CSREAESA
2009
13 years 7 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...