12 search results - page 1 / 3 » Fault simulation of interconnect opens in digital CMOS circu... |
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
Chemically Assembled Electronic Nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing di...