12 search results - page 1 / 3 » Hardware Generation of Random Single Input Change Test Seque... |
ET
2002
13 years 4 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
IOLTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
IFIP
2001
Springer
13 years 9 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
COMPSAC
2010
IEEE
13 years 2 months ago
2010
IEEE
An important goal of automatic testing techniques, including random testing is to achieve high code coverage with a minimum set of test cases. To meet this goal, random testing res...