6 search results - page 1 / 2 » On Detection of Resistive Bridging Defects by Low-Temperatur... |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ICCD
1999
IEEE
13 years 9 months ago
1999
IEEE
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at det...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
We investigate defects in CMOS domino gates and derive the test conditions for them. Very-Low-Voltage Testing can improve the defect coverage, which we define as the maximum detec...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
The interconnection network consumes the majority of die area in an FPGA. Presented is a scalable manufacturing test method for all SRAM-based FPGAs, able to detect multiple inter...