36 search results - page 3 / 8 » On generating compact test sequences for synchronous sequent... |
ICCAD
1999
IEEE
13 years 10 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...
ATS
1998
IEEE
13 years 10 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
DATE
1997
IEEE
13 years 10 months ago
1997
IEEE
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
ICCAD
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...