34 search results - page 2 / 7 » On test conditions for the detection of open defects |
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...
GLVLSI
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
MTDT
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...