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DAC
2005
ACM
13 years 7 months ago
Asynchronous circuits transient faults sensitivity evaluation
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
Yannick Monnet, Marc Renaudin, Régis Leveug...
DFT
2005
IEEE
92views VLSI» more  DFT 2005»
13 years 11 months ago
On the Effect of Stuck-at Faults on Delay-insensitive Nanoscale Circuits
Jia Di, Parag K. Lala, D. P. Vasudevan
DSD
2007
IEEE
132views Hardware» more  DSD 2007»
13 years 9 months ago
On-Chip Cache Device Scaling Limits and Effective Fault Repair Techniques in Future Nanoscale Technology
In this study, we investigate different cache fault tolerance techniques to determine which will be most effective when on-chip memory cell defect probabilities exceed those of cu...
David Roberts, Nam Sung Kim, Trevor N. Mudge
ISCAS
2007
IEEE
106views Hardware» more  ISCAS 2007»
13 years 11 months ago
Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang...
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
13 years 7 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao