34 search results - page 5 / 7 » On the Generation of Multiplexer Circuits for Pass Transisto... |
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
GLVLSI
2003
IEEE
13 years 11 months ago
2003
IEEE
It is likely that it will become increasingly difficult to manufacture the complex, heterogeneous logic structures that characterise current reconfigurable logic systems. As a res...
AC
2003
Springer
13 years 11 months ago
2003
Springer
Abstract. As semiconductor technology strides towards billions of transistors on a single die, problems concerned with deep sub-micron process features and design productivity call...
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
— Since rapid progress has been made in device improvement and integration of small carbon nanotube fieldeffect transistors (CNFETs) circuits, the time has come for developing c...
EVOW
2001
Springer
13 years 10 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...