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ISPD
2006
ACM
83views Hardware» more  ISPD 2006»
13 years 11 months ago
Optimal partitioned fault-tolerant bus layout for reducing power in nanometer designs
Shanq-Jang Ruan, Edwin Naroska, Chun-Chih Chen
DATE
2009
IEEE
171views Hardware» more  DATE 2009»
13 years 9 months ago
Physically clustered forward body biasing for variability compensation in nanometer CMOS design
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
Ashoka Visweswara Sathanur, Antonio Pullini, Luca ...
ASPDAC
2006
ACM
115views Hardware» more  ASPDAC 2006»
13 years 11 months ago
Area optimization for leakage reduction and thermal stability in nanometer scale technologies
- Traditionally, minimum possible area of a VLSI layout is considered the best for delay and power minimization due to decreased interconnect capacitance. This paper shows however ...
Ja Chun Ku, Yehea I. Ismail
CODES
2004
IEEE
13 years 9 months ago
Power analysis of system-level on-chip communication architectures
For complex System-on-chips (SoCs) fabricated in nanometer technologies, the system-level on-chip communication architecture is emerging as a significant source of power consumpti...
Kanishka Lahiri, Anand Raghunathan
DAC
1999
ACM
13 years 9 months ago
Reducing Cross-Coupling Among Interconnect Wires in Deep-Submicron Datapath Design
As the CMOS technology enters the deep submicron design era, the lateral inter-wire coupling capacitance becomes the dominant part of load capacitance and makes RC delay on the bu...
Joon-Seo Yim, Chong-Min Kyung