24 search results - page 4 / 5 » Partial Error Masking to Reduce Soft Error Failure Rate in L... |
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
IOLTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises s...