23 search results - page 1 / 5 » SRAM parametric failure analysis |
DAC
2009
ACM
14 years 5 months ago
2009
ACM
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
TCAD
2008
13 years 4 months ago
2008
Abstract--In this paper, we present a postsilicon-tuning technique to improve parametric yield of SRAM array using body bias (BB). First, we show that, although parametric failures...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
SOCC
2008
IEEE
13 years 11 months ago
2008
IEEE
— Several design metrics have been used in the past to evaluate the SRAM cell stability. However, most of them fail to provide the exact stability figures as shown in this paper...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
In this paper, an adaptive sampling method is proposed for the statistical SRAM cell analysis. The method is composed of two components. One part is the adaptive sampler that manip...