30 search results - page 1 / 6 » Soft Error Modeling and Protection for Sequential Elements |
DFT
2005
IEEE
13 years 10 months ago
2005
IEEE
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
ISQED
2010
IEEE
13 years 10 months ago
2010
IEEE
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
ICCD
2008
IEEE
14 years 1 months ago
2008
IEEE
- This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conve...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...