37 search results - page 1 / 8 » Timing analysis in presence of supply voltage and temperatur... |
ISPD
2006
ACM
13 years 11 months ago
2006
ACM
ASPDAC
2007
ACM
13 years 7 months ago
2007
ACM
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
DAC
2005
ACM
14 years 6 months ago
2005
ACM
We present a new methodology which takes into consideration the effect of Within-Die (WID) process variations on a low-voltage parallel system. We show that in the presence of pro...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2005
IEEE
13 years 11 months ago
2005
IEEE
This paper discusses clock skew due to manufacturing variability and environmental change. In clock tree design, transition time constraint is an important design parameter that c...