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DSD
2010
IEEE
111views Hardware» more  DSD 2010»
13 years 3 months ago
Faults Coverage Improvement Based on Fault Simulation and Partial Duplication
— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
Jaroslav Borecky, Martin Kohlik, Hana Kubatova, Pa...
TVLSI
2002
102views more  TVLSI 2002»
13 years 4 months ago
Algorithm level re-computing using implementation diversity: a register transfer level concurrent error detection technique
Concurrent error detection (CED) based on time redundancy entails performing the normal computation and the re-computation at different times and then comparing their results. Time...
Ramesh Karri, Kaijie Wu
IJCSA
2007
101views more  IJCSA 2007»
13 years 4 months ago
Concurrent Error Detection in S-boxes
In this paper we present low -cost, concurrent checking methods for multiple error detection in S-boxes of symmetric block ciphers. These are redundancy-based fault detection sche...
Ewa Idzikowska, Krzysztof Bucholc
FTCS
1994
140views more  FTCS 1994»
13 years 5 months ago
Concurrent Error Detection in Self-Timed VLSI
This paper examines architectural techniques for providing concurrent error detection in self-timed VLSI pipelines. Signal pairs from Differential Cascode Voltage Switch Logic are...
David A. Rennels, Hyeongil Kim
DFT
2008
IEEE
151views VLSI» more  DFT 2008»
13 years 6 months ago
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller
This paper presents a concurrent error detection technique for the control logic of a modern microprocessor. Our method is based on execution time prediction for each instruction ...
Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris...
FCCM
2000
IEEE
131views VLSI» more  FCCM 2000»
13 years 9 months ago
A Reliable LZ Data Compressor on Reconfigurable Coprocessors
Data compression techniques based on Lempel-Ziv (LZ) algorithm are widely used in a variety of applications, especially in data storage and communications. However, since the LZ a...
Wei-Je Huang, Nirmal R. Saxena, Edward J. McCluske...
DFT
2002
IEEE
103views VLSI» more  DFT 2002»
13 years 9 months ago
Input Ordering in Concurrent Checkers to Reduce Power Consumption
A novel approach for reducing power consumption in checkers used for concurrent error detection is presented. Spatial correlations between the outputs of the circuit that drives t...
Kartik Mohanram, Nur A. Touba
VTS
2003
IEEE
87views Hardware» more  VTS 2003»
13 years 9 months ago
An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...
Haralampos-G. D. Stratigopoulos, Yiorgos Makris
ITC
2003
IEEE
162views Hardware» more  ITC 2003»
13 years 9 months ago
Concurrent Error Detection in Linear Analog Circuits Using State Estimation
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
Haralampos-G. D. Stratigopoulos, Yiorgos Makris
IOLTS
2003
IEEE
138views Hardware» more  IOLTS 2003»
13 years 10 months ago
An Analog Checker With Input-Relative Tolerance for Duplicate Signals
We discuss the design of a novel analog checker that monitors two duplicate signals and provides a digital error indication when their absolute difference is unacceptably large. Th...
Haralampos-G. D. Stratigopoulos, Yiorgos Makris