DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—IP-XACT is a standard for describing intellectual property metadata for System-on-Chip (SoC) integration. Reesearchers have proposed visualizing and abstracting IP-XACT objects ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—This paper presents an accurate interconnect thermal model for analyzing the temperature distribution of an on-chip interconnect wire. The model addresses the ambient te...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
We consider multiprocessor distributed real-time systems where concurrency control is managed using software transactional memory (or STM). For such a system, we propose an algori...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— Today's innovations in the automotive sector are, to a great extent, based on electronics. The increasing integration complexity and stringent cost reduction goals turn E/...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE