Recently, a new Dynamic Voltage Scaling (DVS) scheme has been proposed that increases energy efficiency significantly by allowing the processor to operate at or slightly below the...
David Roberts, Todd M. Austin, David Blaauw, Trevo...
— In a battery powered system, a primary design consideration is the battery lifetime. Profile of current drawn from a battery determines its lifetime. Recently in [4] dynamic v...
Yuan Cai, Sudhakar M. Reddy, Irith Pomeranz, Bashi...
A methodology for supporting dynamic voltage scaling (DVS) on commercial FPGAs is described. A logic delay measurement circuit (LDMC) is used to determine the speed of an inverter...
C. T. Chow, L. S. M. Tsui, Philip Heng Wai Leong, ...
On-chip buses are typically designed to meet performance constraints at worst-case conditions, including process corner, temperature, IR-drop, and neighboring net switching patter...
Himanshu Kaul, Dennis Sylvester, David Blaauw, Tre...
In recent years, Globally Asynchronous Locally Synchronous (GALS) designs and dynamic voltage scaling (DVS) have emerged as some of the most popular approaches to address the ever...
In this paper, we identify the key challenges that oppose subthreshold circuit design and describe fabricated chips that verify techniques for overcoming the challenges. Categorie...
Benton H. Calhoun, Alice Wang, Naveen Verma, Anant...
Dynamic voltage scaling and sleep state control have been shown to be extremely effective in reducing energy consumption in CMOS circuits. Though plenty of research papers have st...
Razvan Racu, Arne Hamann, Rolf Ernst, Bren Mochock...
– In support of continuously increasing line rates and various Internet services, multiprocessor-based linecards have appeared in next-generation routers, significantly improving...
Dynamic voltage scaling (DVS) for real-time systems has been extensively studied to save energy. Previous studies consider the probabilistic distributions of tasks’ execution ti...
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M....