Sciweavers

Share
ISQED
2006
IEEE
136views Hardware» more  ISQED 2006»
9 years 11 months ago
An Improved AMG-based Method for Fast Power Grid Analysis
The continuing VLSI technology scaling leads to increasingly significant power supply fluctuations, which need to be modeled accurately in circuit design and verification. Meanwhi...
Cheng Zhuo, Jiang Hu, Kangsheng Chen
ISQED
2006
IEEE
153views Hardware» more  ISQED 2006»
9 years 11 months ago
Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
Chong Zhao, Sujit Dey
ISQED
2006
IEEE
155views Hardware» more  ISQED 2006»
9 years 11 months ago
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
Bin Zhang, Wei-Shen Wang, Michael Orshansky
ISQED
2006
IEEE
90views Hardware» more  ISQED 2006»
9 years 11 months ago
Monte Carlo-Alternative Probabilistic Simulations for Analog Systems
Probabilistic system simulations for analog circuits have traditionally been handled with Monte Carlo analysis. For a manufacturable design, fast and accurate simulations are nece...
Rasit Onur Topaloglu
ISQED
2006
IEEE
123views Hardware» more  ISQED 2006»
9 years 11 months ago
A Simulation-Based Soft Error Estimation Methodology for Computer Systems
This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in...
Makoto Sugihara, Tohru Ishihara, Masanori Muroyama...
ISQED
2006
IEEE
126views Hardware» more  ISQED 2006»
9 years 11 months ago
Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity
The increase in packing density has led to a higher power density in the chip which in turn has led to an increase in temperature on the chip. Temperature affects reliability, per...
Anand Ramalingam, David Z. Pan, Frank Liu, Sani R....
ISQED
2006
IEEE
90views Hardware» more  ISQED 2006»
9 years 11 months ago
Advances in Computation of the Maximum of a Set of Random Variables
This paper quantifies the approximation error in Clark’s approach [1] to computing the maximum (max) of Gaussian random variables; a fundamental operation in statistical timing...
Debjit Sinha, Hai Zhou, Narendra V. Shenoy
ISQED
2006
IEEE
101views Hardware» more  ISQED 2006»
9 years 11 months ago
Compiler-Directed Power Density Reduction in NoC-Based Multi-Core Designs
As transistor counts keep increasing and clock frequencies rise, high power consumption is becoming one of the most important obstacles, preventing further scaling and performance...
Sri Hari Krishna Narayanan, Mahmut T. Kandemir, Oz...
ISQED
2006
IEEE
69views Hardware» more  ISQED 2006»
9 years 11 months ago
Statistical Analysis of Capacitance Coupling Effects on Delay and Noise
Usha Narasimha, Binu Abraham, N. S. Nagaraj
books