ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
The continuing VLSI technology scaling leads to increasingly significant power supply fluctuations, which need to be modeled accurately in circuit design and verification. Meanwhi...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
Probabilistic system simulations for analog circuits have traditionally been handled with Monte Carlo analysis. For a manufacturable design, fast and accurate simulations are nece...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
The increase in packing density has led to a higher power density in the chip which in turn has led to an increase in temperature on the chip. Temperature affects reliability, per...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper quantifies the approximation error in Clark’s approach [1] to computing the maximum (max) of Gaussian random variables; a fundamental operation in statistical timing...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
As transistor counts keep increasing and clock frequencies rise, high power consumption is becoming one of the most important obstacles, preventing further scaling and performance...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE