ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
NPTest CMOS formatter, embedded within the new timing generation IC, can provide formatted levels and internal strobe markers for eight independent pinelectronics channels at up t...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper is a technology review of PXI. It describes the basic PXI architecture and looks in more detail at the features of the slot 2 timing and triggering module.