ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
- A low overhead circuit technique is proposed in this paper for simultaneously reducing subthreshold and gate oxide leakage currents in domino logic circuits. PMOS sleep transisto...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISPD
2009
ACM
13 years 11 months ago
2009
ACM
Gate sizing and threshold voltage (Vt) assignment are popular techniques for circuit timing and power optimization. Existing methods, by and large, are either sensitivity-driven h...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
As technology advances, the metal width is decreasing with the length increasing, making the resistance along the power line increase substantially. Together with the nonlinear sc...