151
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ICCAD
1995
IEEE
15 years 8 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
227
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INFOCOM
1997
IEEE
15 years 8 months ago
1997
IEEE
In this paper we present algorithms for flow admission control at an EDF link scheduler when the flows are characterized by peak rate, average rate and burst size. We show that th...
150
click to vote
ICCAD
1995
IEEE
15 years 8 months ago
1995
IEEE
We address the problem of minimizing power consumption in behavioral synthesis of data-dominated circuits. The complex nature of power as a cost function implies that the effects ...
154
click to vote
ICCAD
1995
IEEE
15 years 8 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...