26 search results - page 4 / 6 » Adaptive Diagnostic Pattern Generation for Scan Chains |
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
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DFT
2008
IEEE
15 years 4 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
ISBI
2006
IEEE
15 years 3 months ago
2006
IEEE
This contribution describes a novel non-contact fluorescence optical tomography scheme which utilizes multiple area illumination patterns, to reduce the illposedness of the inver...
112
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ATS
2005
IEEE
15 years 3 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ARCS
2005
Springer
15 years 3 months ago
2005
Springer
We propose an active vision system for object acquisition. The core of our approach is a reinforcement learning module which learns a strategy to scan an object. The agent moves a...