Sciweavers

4299 search results - page 116 / 860
» Concurrent Test Generation
Sort
View
146
Voted
ICCAD
1995
IEEE
76views Hardware» more  ICCAD 1995»
15 years 11 months ago
Design verification via simulation and automatic test pattern generation
Hussain Al-Asaad, John P. Hayes
165
Voted
SAC
1997
ACM
15 years 11 months ago
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
158
Voted
ITC
1995
IEEE
107views Hardware» more  ITC 1995»
15 years 11 months ago
Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
Xavier Haurie, Gordon W. Roberts
178
Voted
VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 11 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
149
Voted
VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
15 years 11 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...