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    ICCAD
    1995
    IEEE
    76views Hardware» more  ICCAD 1995»
    Design verification via simulation and automatic test pattern generation
    15 years 7 months ago
    Design verification via simulation and automatic test pattern generation
    Download  www.ece.ucdavis.edu
    Hussain Al-Asaad, John P. Hayes
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    SAC
    1997
    ACM
    108views Applied Computing» more  SAC 1997»
    SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
    15 years 7 months ago
    SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
    Download  www.cad.polito.it
    Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
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    ITC
    1995
    IEEE
    107views Hardware» more  ITC 1995»
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
    15 years 7 months ago
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
    Download  www.ece.mcgill.ca
    Xavier Haurie, Gordon W. Roberts
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    VLSID
    1995
    IEEE
    112views VLSI» more  VLSID 1995»
    An efficient automatic test generation system for path delay faults in combinational circuits
    15 years 7 months ago
    An efficient automatic test generation system for path delay faults in combinational circuits
    Download  eprints.iisc.ernet.in
    Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
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    VLSID
    1995
    IEEE
    107views VLSI» more  VLSID 1995»
    Functional test generation for non-scan sequential circuits
    15 years 7 months ago
    Functional test generation for non-scan sequential circuits
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    Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
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