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» Functional Scan Chain Testing
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115
Voted
VTS
2007
IEEE
79views Hardware» more  VTS 2007»
15 years 8 months ago
Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
Richard Putman, Nur A. Touba
86
Voted
DAC
2001
ACM
16 years 3 months ago
Test Volume and Application Time Reduction Through Scan Chain Concealment
Ismet Bayraktaroglu, Alex Orailoglu
DATE
2006
IEEE
82views Hardware» more  DATE 2006»
15 years 8 months ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito
99
Voted
ITC
2003
IEEE
93views Hardware» more  ITC 2003»
15 years 7 months ago
On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs
Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz