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76
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VTS
2007
IEEE
79views Hardware» more  VTS 2007»
15 years 3 months ago
Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
Richard Putman, Nur A. Touba
66
Voted
DATE
2006
IEEE
82views Hardware» more  DATE 2006»
15 years 3 months ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito