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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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103
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ET
2006
120views more  ET 2006»
15 years 1 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
64
Voted
ICCAD
2004
IEEE
99views Hardware» more  ICCAD 2004»
15 years 10 months ago
SPIN-TEST: automatic test pattern generation for speed-independent circuits
Feng Shi, Yiorgos Makris
DATE
2003
IEEE
62views Hardware» more  DATE 2003»
15 years 7 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...
74
Voted
GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
15 years 6 months ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...