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GLVLSI
1999
IEEE

Pseudo-Exhaustive Testing of Sequential Circuits

10 years 1 months ago
Pseudo-Exhaustive Testing of Sequential Circuits
Bassam Shaer, Sami A. Al-Arian, David L. Landis
Added 03 Aug 2010
Updated 03 Aug 2010
Type Conference
Year 1999
Where GLVLSI
Authors Bassam Shaer, Sami A. Al-Arian, David L. Landis
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