23 search results - page 2 / 5 » Application of Built in Self-Test for Interconnect Testing o... |
FPL
2004
Springer
13 years 11 months ago
2004
Springer
This paper presents a novel approach to interconnect fault location for FPGAs during power-on sequence. The method is based on a concept known as fault grading which utilizes defec...
CSREAESA
2009
13 years 7 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
CATA
2009
13 years 7 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
VTS
2002
IEEE
13 years 11 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...