128 search results - page 4 / 26 » Microprocessor Based Testing for Core-Based System on Chip |
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
FPGA
2004
ACM
13 years 11 months ago
2004
ACM
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microprocessors. Thus, the designer can evaluate if a particular block is working bey...
VLSI
2005
Springer
13 years 11 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
DT
2000
13 years 5 months ago
2000
f abstraction as applicable to break the problem's complexity, and innovating better techniques to address complexity of new microarchitectural features. Validation techniques...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...