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DAC
1997
ACM
13 years 9 months ago
Efficient Testing of Clock Regenerator Circuits in Scan Designs
Rajesh Raina, Robert Bailey, Charles Njinda, Rober...
DAC
1997
ACM
13 years 9 months ago
A Hybrid Algorithm for Test Point Selection for Scan-Based BIST
Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Su...
ISCAS
2005
IEEE
129views Hardware» more  ISCAS 2005»
13 years 11 months ago
A reconfigurable architecture for scanning biosequence databases
—Unknown protein sequences are often compared to a set of known sequences (a database scan) to detect functional similarities. Even though efficient dynamic programming algorithm...
Timothy F. Oliver, Bertil Schmidt, Douglas L. Mask...
VTS
2005
IEEE
106views Hardware» more  VTS 2005»
13 years 11 months ago
Segmented Addressable Scan Architecture
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuc...