Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
Kristen R. Walcott, Greg Humphreys, Sudhanva Gurum...
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...