ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
ISPASS
2007
IEEE
13 years 11 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
ISCA
2007
IEEE
13 years 11 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
DSD
2007
IEEE
13 years 11 months ago
2007
IEEE
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ISCA
2008
IEEE
13 years 11 months ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
ICPP
2008
IEEE
13 years 11 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...