Sciweavers

ICCD
1995
IEEE
83views Hardware» more  ICCD 1995»
15 years 26 days ago
Concurrent timing optimization of latch-based digital systems
Many design techniques have been proposed to optimize the performance of a digital system implemented in a given technology. Each of these techniques can be advantageous in partic...
Hong-Yean Hsieh, Wentai Liu, Ralph K. Cavin III, C...
ICCD
1995
IEEE
51views Hardware» more  ICCD 1995»
15 years 26 days ago
Implementing a STARI chip
STARI is a high-speed signaling technique that uses both synchronous and self-timed circuits. To demonstrate STARI, a chip has been fabricated using the MOSIS 2 CMOS process. In a...
Mark R. Greenstreet
ICCD
1995
IEEE
109views Hardware» more  ICCD 1995»
15 years 26 days ago
Verifying the performance of the PCI local bus using symbolic techniques
Symbolic model checking is a successful technique for checking properties of large finite-state systems. This method has been used to verify a number of real-world hardware desig...
Sérgio Vale Aguiar Campos, Edmund M. Clarke...
ICCAD
1995
IEEE
77views Hardware» more  ICCAD 1995»
15 years 26 days ago
PARAS: system-level concurrent partitioning and scheduling
Partitioning for the ASIC designs is examined and the interaction between high-level synthesis and partitioning is studied and incorporated in the solution. Four algorithms (calle...
Wing Hang Wong, Rajiv Jain
ICCAD
1995
IEEE
129views Hardware» more  ICCAD 1995»
15 years 26 days ago
Activity-driven clock design for low power circuits
In this paper we investigate activity-driven clock trees to reduce the dynamic power consumption of synchronous digital CMOS circuits. Sections of an activity-driven clock tree ca...
Gustavo E. Téllez, Amir H. Farrahi, Majid S...
ICCAD
1995
IEEE
96views Hardware» more  ICCAD 1995»
15 years 26 days ago
Delay optimal partitioning targeting low power VLSI circuits
Hirendu Vaishnav, Massoud Pedram
ICCAD
1995
IEEE
94views Hardware» more  ICCAD 1995»
15 years 26 days ago
Test register insertion with minimum hardware cost
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
Albrecht P. Stroele, Hans-Joachim Wunderlich