Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...