31 search results - page 2 / 7 » Efficient Hardware for Antialiasing Coverage Mask Generation |
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 3 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
GRAPHICSINTERFACE
2000
13 years 6 months ago
2000
We present a method to incrementally voxelize triangles into a volumetric dataset with pre-filtering, generating an accurate multivalued voxelization. Multivalued voxelization all...
DATE
2009
IEEE
14 years 17 hour ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
ICES
2000
Springer
13 years 8 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...