ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Influence of manufacturing variability on circuit performance has been increasing because of finer manufacturing process and lowered supply voltage. In this paper, we focus on m...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulati...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
We present an error-tolerant SRAM design optimized for ultra-low standby power. Using SRAM cell optimization techniques, the maximum data retention voltage (DRV) of a 90nm 26kb SR...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper examines latch style voltage mode sense amplifiers for operation in the sub-threshold region, where VDD<VT. We show that the offset gets worse relative to strong inv...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
We proposed a combined magnetic and circuit level technique to explore the design methodology of SpinTorque Transfer RAM (SPRAM). A dynamic magnetic model of magnetic tunneling ju...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
— Designers require variational information for robust designs. Characterization of such information can be costly for the novel nanoparticle interconnect process, which utilize ...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
