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ITC
2000
IEEE
101views Hardware» more  ITC 2000»
9 years 3 months ago
Reducing test data volume using external/LBIST hybrid test patterns
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
Debaleena Das, Nur A. Touba
ICECCS
2002
IEEE
85views Hardware» more  ICECCS 2002»
9 years 4 months ago
Fault Detection Effectiveness of Spathic Test Data
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
Jane Huffman Hayes, Pifu Zhang
DFT
2002
IEEE
128views VLSI» more  DFT 2002»
9 years 4 months ago
Matrix-Based Test Vector Decompression Using an Embedded Processor
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
Kedarnath J. Balakrishnan, Nur A. Touba
DATE
2002
IEEE
135views Hardware» more  DATE 2002»
9 years 4 months ago
Reducing Test Application Time Through Test Data Mutation Encoding
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
Sherief Reda, Alex Orailoglu
DATE
2002
IEEE
103views Hardware» more  DATE 2002»
9 years 4 months ago
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
Anshuman Chandra, Krishnendu Chakrabarty
TOOLS
2010
IEEE
9 years 4 months ago
Contract-Driven Testing of JavaScript Code
JSContest is a tool that enhances JavaScript with simple, type-like contracts and provides a framework for monitoring and guided random testing of programs against these contracts ...
Phillip Heidegger, Peter Thiemann
VTS
2003
IEEE
119views Hardware» more  VTS 2003»
9 years 4 months ago
Test Data Compression Using Dictionaries with Fixed-Length Indices
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
Lei Li, Krishnendu Chakrabarty
QSIC
2003
IEEE
9 years 4 months ago
Character String Predicate Based Automatic Software Test Data Generation
A character string is an important element in programming. A problem that needs further research is how to automatically generate software test data for character strings. This pa...
Ruilian Zhao, Michael R. Lyu
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
9 years 4 months ago
A Hybrid Coding Strategy For Optimized Test Data Compression
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
Armin Würtenberger, Christofer S. Tautermann,...
ITC
2003
IEEE
205views Hardware» more  ITC 2003»
9 years 4 months ago
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Ki...
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