ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
ICECCS
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
DFT
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
TOOLS
2010
IEEE
13 years 10 months ago
2010
IEEE
JSContest is a tool that enhances JavaScript with simple, type-like contracts and provides a framework for monitoring and guided random testing of programs against these contracts ...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
QSIC
2003
IEEE
13 years 10 months ago
2003
IEEE
A character string is an important element in programming. A problem that needs further research is how to automatically generate software test data for character strings. This pa...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...