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DATE
2003
IEEE
96views Hardware» more  DATE 2003»
9 years 5 months ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...
COMPSAC
2003
IEEE
9 years 5 months ago
Automated Metamorphic Testing
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...
Arnaud Gotlieb, Bernard Botella
VLSI
2005
Springer
9 years 5 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
PAKDD
2005
ACM
128views Data Mining» more  PAKDD 2005»
9 years 5 months ago
A Framework for Incorporating Class Priors into Discriminative Classification
Abstract. Discriminative and generative methods provide two distinct approaches to machine learning classification. One advantage of generative approaches is that they naturally mo...
Rong Jin, Yi Liu
GECCO
2005
Springer
132views Optimization» more  GECCO 2005»
9 years 5 months ago
Evolutionary testing of state-based programs
The application of Evolutionary Algorithms to structural test data generation, known as Evolutionary Testing, has to date largely focused on programs with input-output behavior. H...
Phil McMinn, Mike Holcombe
DSD
2005
IEEE
116views Hardware» more  DSD 2005»
9 years 5 months ago
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
DATE
2005
IEEE
204views Hardware» more  DATE 2005»
9 years 5 months ago
Evaluation of Error-Resilience for Reliable Compression of Test Data
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
Hamidreza Hashempour, Luca Schiano, Fabrizio Lomba...
ACMSE
2006
ACM
9 years 6 months ago
Automatic support for testing web-based enterprise applications
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...
Arturo Sanchez, Brandon Vega, Alexander Gonzalez, ...
QSIC
2006
IEEE
9 years 6 months ago
A Test Data Generation Tool for Unit Testing of C Programs
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...
Zhongxing Xu, Jian Zhang
ICMCS
2006
IEEE
112views Multimedia» more  ICMCS 2006»
9 years 6 months ago
Multipoint Measuring System for Video and Sound - 100-camera and microphone system
We developed a novel multipoint measurement system capable of acquiring video and sound at more than 100 points in a "synchronized" manner. In this paper, we first descr...
Toshiaki Fujii, Kensaku Mori, Kazuya Takeda, Kenji...
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