152
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DATE
15 years 2 months ago
2005 IEEE 
Designers of factory automation applications increasingly demand for tools for rapid prototyping of hardware extensions to existing systems and verification of resulting behavior...
DATE
15 years 2 months ago
2005 IEEE
Both the number of embedded memories, as well as the total embedded memory content in our chips is growing steadily. Time for chip designers, EDA makers, and test engineers to upd...
DATE
15 years 2 months ago
2005 IEEE
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
74
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DATE
15 years 2 months ago
2005 IEEE
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
DATE
15 years 2 months ago
2005 IEEE
This paper briefly describes the picoArrayTM architecture, and in particular the deterministic internal communication fabric. The methods that have been developed for debugging a...
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