133
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ICCAD
16 years 1 months ago
2005 IEEE 
Future inter- and intra-ULSI interconnect systems demand extremely high data rates as well as bi-directional multi-I/O concurrent service, re-configurable computing/processing arc...
124
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ICCAD
15 years 10 months ago
2005 IEEE 
Suppression of leakage current and reduction in device-todevice variability will be key challenges for sub-45nm CMOS technologies. Non-classical transistor structures such as the ...
133
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ICCAD
16 years 1 months ago
2005 IEEE 
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
117
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ICCAD
16 years 1 months ago
2005 IEEE 
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
136
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ICCAD
16 years 1 months ago
2005 IEEE
— This paper addresses the problem of equivalence verification of RTL descriptions. The focus is on datapathoriented designs that implement polynomial computations over fixed-s...
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