126
click to vote
ICCAD
16 years 19 days ago
2005 IEEE 
Future inter- and intra-ULSI interconnect systems demand extremely high data rates as well as bi-directional multi-I/O concurrent service, re-configurable computing/processing arc...
116
click to vote
ICCAD
15 years 9 months ago
2005 IEEE 
Suppression of leakage current and reduction in device-todevice variability will be key challenges for sub-45nm CMOS technologies. Non-classical transistor structures such as the ...
126
Voted
ICCAD
16 years 19 days ago
2005 IEEE 
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
113
click to vote
ICCAD
16 years 19 days ago
2005 IEEE 
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
130
click to vote
ICCAD
16 years 19 days ago
2005 IEEE
— This paper addresses the problem of equivalence verification of RTL descriptions. The focus is on datapathoriented designs that implement polynomial computations over fixed-s...
|
Hardware