175
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ICCD
16 years 22 days ago
2008 IEEE 
— Run-time Active Leakage Reduction (RALR) is a recent technique and aims at aggressively reducing leakage power consumption. This paper studies the feasibility of RALR from the ...
198
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ICCD
16 years 23 days ago
2008 IEEE
— Clock frequency and transistor density increases have resulted in elevated chip temperatures. In order to meet temperature constraints while still exploiting the performance op...
113
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ICCD
16 years 22 days ago
2008 IEEE
— Increasing sizes of benchmarks make detailed simulation an extremely time consuming process. Statistical techniques such as the SimPoint methodology have been proposed in order...
157
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ICCD
16 years 22 days ago
2008 IEEE 
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
109
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ICCD
16 years 23 days ago
2008 IEEE 
— This paper looks at designing circuit elements that will be constructed with nanoscale magnets within the Quantum-dot Cellular Automata (QCA) computational paradigm. In magneti...
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