140
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15 years 9 months ago
2008 IEEE 
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
122
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VTS
15 years 9 months ago
2008 IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
119
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VTS
15 years 9 months ago
2008 IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
123
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15 years 9 months ago
2008 IEEE  132
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VTS
15 years 9 months ago
2008 IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
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