DFT
15 years 18 days ago
2004 IEEE 
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
DFT
15 years 18 days ago
2004 IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
DFT
15 years 18 days ago
2004 IEEE 
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
DFT
15 years 18 days ago
2004 IEEE
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...
DFT
15 years 18 days ago
2004 IEEE
In this paper, a simple codec algorithm based on Reed-Solomon (RS) codes is proposed for erasure correcting in RAID (Redundant Array of Independent Disks) level 6 systems. Unlike ...
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VLSI