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DFT
2004
IEEE
174views VLSI» more  DFT 2004»
15 years 10 months ago
Defect Avoidance in a 3-D Heterogeneous Sensor
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...
Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
DFT
2004
IEEE
101views VLSI» more  DFT 2004»
15 years 10 months ago
Designs for Reducing Test Time of Distributed Small Embedded SRAMs
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
Baosheng Wang, Yuejian Wu, André Ivanov
DFT
2004
IEEE
94views VLSI» more  DFT 2004»
15 years 10 months ago
Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
DFT
2004
IEEE
90views VLSI» more  DFT 2004»
15 years 10 months ago
An XOR Based Reed-Solomon Algorithm for Advanced RAID Systems
In this paper, a simple codec algorithm based on Reed-Solomon (RS) codes is proposed for erasure correcting in RAID (Redundant Array of Independent Disks) level 6 systems. Unlike ...
Ping-Hsun Hsieh, Ing-Yi Chen, Yu-Ting Lin, Sy-Yen ...
DFT
2004
IEEE
78views VLSI» more  DFT 2004»
15 years 10 months ago
Reliability Modeling and Assurance of Clockless Wave Pipeline
This paper presents theoretical yet practical methodologies to model, assure and optimize the Reliability of Clockless Wave Pipeline. Clockless wave pipeline is a cutting-edge and...
T. Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lomb...
VLSI
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