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DFT
15 years 4 months ago
2007 IEEE 
This paper presents the adoption of the Triple Modular Redundancy coupled with the Partial Dynamic Reconfiguration of Field Programmable Gate Arrays to mitigate the effects of Sof...
DFT
15 years 6 months ago
2007 IEEE 
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
DFT
15 years 6 months ago
2007 IEEE 
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
DFT
15 years 6 months ago
2007 IEEE 
We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry....
DFT
15 years 6 months ago
2007 IEEE
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...
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