142
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ITC
15 years 4 months ago
1995 IEEE 
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
104
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ITC
15 years 4 months ago
1995 IEEE 
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
104
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ITC
15 years 4 months ago
1995 IEEE
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
102
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ITC
15 years 4 months ago
1995 IEEE 
Real-world data is known to be imperfect, suffering from various forms of defects such as sensor variability, estimation errors, uncertainty, human errors in data entry, and gaps ...
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Hardware